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Hello!

You are invited to this webinar hosted by SEMI Electronics Materials Group (EMG) to discuss the defect detection and material quality for advanced nodes. You don’t want to miss this opportunity.

Pushing the Limits of Defect Detection and Material Quality for Advanced Nodes

 Date: June 27, 2018
Time: 10 AM Pacific Daylight-Saving Time (PST)
Hosted by SEMI Electronics Materials Group
Complimentary for SEMI members, and $99 for non-members

Register Now

If you are interested in joining the webinar, but can’t make the live version,
please 
register and we will email you a link to view when it is convenient.

Abstract

As the industry pushes to smaller nodes and higher requirements, detecting defects and eliminating their sources is becoming more critical. However, as we push the limits of semiconductor technology nodes, impurities and small variations have a larger impact on material quality and standard specifications and quality systems are not enough. Traditionally the industry approached this this problem mainly through advances in defect detection and classification, but recently there has been a push to reduce defects and excursions through advances in material characterization throughout the supply chain as well. This webinar will cover both topics with KLA presenting on latest advances in defect detection and classification and Brewer Science presenting the concept and implementation of fingerprinting and advanced material characterization of materials used in semiconductor manufacturing.

Featured speakers

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Ramon Ynzunza, Ph.D.
Senior Manager Technical Programs, Global Customer Solutions Group at KLA-Tencor

Ramon joined KLA-Tencor in 2000 as a research scientist in the Wafer Inspection Group and has worked in a variety of applications-related roles within the Broadband Plasma Division and Wafer Inspection Group. Before joining KLA-Tencor, Ynzunza began his post-doctorate career with Intel Corporation as a process engineer in their Failure Analysis Group, developing a micro X-ray photo-election microscope using synchrotron radiation. Ramon holds a master’s and Ph.D. in solid state physics specializing in surface science from the University of California.

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Yongqing Jiang
Analytical Testing Unit Manager at Brewer Science

Yongqing Jiang is the Analytical Testing Unit manager at Brewer Science Inc.. She earned her Ph.D degree in Analytical Chemistry from Missouri University of Science & Technology in 2010. Yongqing has broad knowledge and extensive experience in analytical chemistry, from environmental, bio-analysis to material characterization, especially semiconductor materials. Her credits include 12 publications, 11 presentations and 3 patents. Yongqing joined Brewer Science Inc. in 2012. She leads the Analytical Testing Unit to characterize all the materials and evaluate various processes, and so ensure product quality and continuous improvements.

We look forward seeing you at this event.

Questions? Please contact Ayo Kajopaiye at akajopaiye@semi.org 

The Electronic Materials Group (EMG) is a technology community representing SEMI member companies that provide substrates, polymers, metals, organic and inorganic materials, chemicals, and gases that are developed or in use for the manufacturing of electronics. To learn more about EMG, click here.