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Volume 13, Issue 1
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From the Director's Desk
James Amano, Senior Director

Equipment Data Acquisition and Smart Manufacturing
Manufacturers are increasingly adopting the SEMI Equipment Data Acquisition (EDA) suite of standards. Read More

Japan Standards Awards
SEMI honored industry leaders for their outstanding accomplishments in developing Standards for the electronics and related industries. Read More

Korea Standards Awards
Three members of the Korea FPD Metrology TC Chapter received the SEMI Recognition Award. Read More

China SEMI HB-LED Update—December 2017
Although the industry faces challenges, critical SEMI Standards development efforts continue. Read More

New Standard, Specification for Reference Material for Bonded Wafer Stack Void Metrology
SEMI 3D17 describes test structures, including design, manufacturing, and certification procedure for a bonded wafer reference sample composed of two wafers. Read More

New Standard, Specification of Indoor Lighting Simulator Requirements for Emerging Photovoltaic
Testing equipment for evaluation of emerging PV technologies is increasingly necessary. Read More

Next-Generation SEMI Equipment Data Acquisition (EDA) Standards
The microelectronics supply chain is seeking standardized data collection and automation strategies for big data transfers. Read More

SEMI forms Technology Communities
SEMI forms Technology Communities to speed industry collaboration and innovation. Read More

March 14-16
April 9-12

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